DocumentCode :
49726
Title :
Impact of Technology Scaling on ISFET Performance for Genetic Sequencing
Author :
Miscourides, Nicholas ; Georgiou, Pantelis
Author_Institution :
Dept. of Electr. & Electron. Eng., Imperial Coll. London, London, UK
Volume :
15
Issue :
4
fYear :
2015
fDate :
Apr-15
Firstpage :
2219
Lastpage :
2226
Abstract :
This paper investigates the impact of technology scaling according to Moore´s law on the performance of ion-sensitive field-effect transistors (ISFETs) as pH sensors for genetic sequencing. Two commercial CMOS process families, including 0.35, 0.18, 0.13, and 0.09 μm m processing nodes, have been used to model ISFETs of different sizes and biasing conditions with simulation results indicating that the noise behavior of a ISFET deviates significantly from the underlying MOSFETs. In particular, a capacitive division effect is observed at the gate due to the passivation and parasitic capacitances, effectively attenuating any signal and noise. The dependence of the attenuation on gate parasitics means that smaller devices, which operate in the weak inversion region, cause the least attenuation, therefore, lowest input referred noise, a result that is contradictory to what is expected with MOSFETs.
Keywords :
MOSFET; biomedical electronics; biomedical equipment; capacitance; electrochemical sensors; genetics; ion sensitive field effect transistors; pH measurement; passivation; semiconductor device models; semiconductor device noise; CMOS process; ISFET performance; MOSFET; Moore law; biasing condition; capacitive division effect; gate parasitics; genetic sequencing; input referred noise; inversion region; ion-sensitive field-effect transistors; noise behavior; pH sensors; parasitic capacitances; passivation; size 0.09 mum; size 0.13 mum; size 0.18 mum; size 0.35 mum; technology scaling; Capacitance; Genetics; Logic gates; Noise; Passivation; Sensors; Sequential analysis; DNA; ISFET; Moore’s law; Moore???s law; chemical sensors; genetics; sequencing;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2014.2372851
Filename :
6963355
Link To Document :
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