Title :
Research on Thickness Measurement of Transparent Object Based on CCD Vision System
Author :
Yang Ni ; Wang Yu-tian ; Lv Jiang-tao ; Li Huan-huan
Author_Institution :
MTI Key Lab. of Hebei Province, Yanshan Univ., Qinhuangdao, China
Abstract :
Novel thickness measurement of transparent object based on line-structured laser and CCD vision technique is present in this paper. The measurement of light stripe image distance is transformed from the measurement of thickness. This article focuses on the experiment design, and the factors that influence accuracy of measurement are discussed as well. The research with positive laboratory verification has proven the feasibility and validity of photoelectric measurement of transparent object thickness. The resolution of thickness measurement can be 8.2 mum.
Keywords :
CCD image sensors; design of experiments; distance measurement; thickness measurement; CCD vision system; light stripe image distance measurement; line-structured laser; photoelectric measurement; thickness measurement resolution; transparent object thickness; Charge coupled devices; Image edge detection; Laser beams; Machine vision; Optical interferometry; Optical mixing; Optical refraction; Optical scattering; Surface emitting lasers; Thickness measurement; CCD; central orientation; thickness; transparent object;
Conference_Titel :
Measuring Technology and Mechatronics Automation, 2009. ICMTMA '09. International Conference on
Conference_Location :
Zhangjiajie, Hunan
Print_ISBN :
978-0-7695-3583-8
DOI :
10.1109/ICMTMA.2009.594
