DocumentCode
497649
Title
A novel feature line segment approach for pattern classification
Author
Yang, Yi ; Han, Chongzhao ; Han, Deqiang
Author_Institution
Inst. of Integrated Autom., Xi´´an Jiaotong Univ., Xi´´an, China
fYear
2009
fDate
6-9 July 2009
Firstpage
490
Lastpage
497
Abstract
In this paper, a novel pattern classification approach is proposed called shortest feature line segment (SFLS). It retains the ideas and advantages of nearest feature line (NFL) and it can suppress the drawbacks of NFL, i.e., the extrapolation inaccuracy, interpolation inaccuracy and high computational complexity. SFLS uses length of the feature line segment satisfying given geometric relation constraints, instead of the perpendicular distance from query point to feature line in NFL. SFLS has clear geometric-theory foundation and its implementation is relatively simple. In experiments based on artificial datasets and real-world datasets, comparisons between SFLS and other classification methods are provided, including nearest neighbor (NN), k-NN, NFL and some refined NFL methods. Experimental results show that SFLS is a simple yet effective classification approach.
Keywords
geometry; interpolation; learning (artificial intelligence); pattern classification; computational complexity; extrapolation inaccuracy; geometric-theory foundation; interpolation inaccuracy; nearest feature line; nearest neighbor; pattern classification; shortest feature line segment; Automation; Computational complexity; Error analysis; Extrapolation; Face recognition; Information retrieval; Interpolation; Nearest neighbor searches; Neural networks; Pattern classification; Classification; extrapolation inaccuracy; interpolation inaccuracy; nearest feature line (NFL); nearest neighbor (NN);
fLanguage
English
Publisher
ieee
Conference_Titel
Information Fusion, 2009. FUSION '09. 12th International Conference on
Conference_Location
Seattle, WA
Print_ISBN
978-0-9824-4380-4
Type
conf
Filename
5203743
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