Title :
Silicon Physical Unclonable Function resistant to a 1025-trial brute force attack in 90 nm CMOS
Author :
Stanzione, S. ; Iannaccone, G.
Author_Institution :
Dipartimento di Ingegneria dell´´Informazione: Elettronica, Informatica, Telecomunicazioni, UniversitÃ\xa0 di Pisa Via Caruso 16, 56122, Italy
Abstract :
A CMOS 90 nm physical unclonable function (PUF) based on analog signal processing and process variability has been realized, resistant to a brute force attack of more than 1025 trials. Experimental measurements show that the circuit exhibits 38 µW power consumption. Process and temperature monitor and compensator keep the experimental BER below 0.1% at 125°C or with a 10% VDD variation, with excellent accelerated aging behavior.
Keywords :
Accelerated aging; Bit error rate; CMOS process; Circuits; Energy consumption; Power measurement; Signal processing; Silicon; Temperature measurement; Temperature sensors;
Conference_Titel :
VLSI Circuits, 2009 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
978-1-4244-3307-0
Electronic_ISBN :
978-4-86348-001-8
