Title :
Design of an Experimental System for Digital Circuit Fault Diagnosis Based on Support Vector Machine
Author :
Xiusheng, Duan ; Ganlin, Shan ; Qilong, Zhang
Author_Institution :
Dept. of Opt. & Electron. Eng., Ordnance Eng. Coll., Shijiazhuang, China
Abstract :
In order to combine the theory and practice of support vector machine (SVM) in the field of fault diagnosis, a novel universal experimental system for digital circuitspsila fault diagnosis is designed for the application study of SVM. The circuit is simulated in FPGA and its input and output pins are assigned to the DO and DI channels automatically by matrix switch. The faults and test points can be set easily. The algorithms of SVM and test vector generation etc. can be carried out in different software modules. The overall design and experimentation are discussed in detail. A practical example is given also. The experimental system is very convenient for the study of SVM and the efficiency is improved observably.
Keywords :
circuit analysis computing; digital circuits; fault diagnosis; field programmable gate arrays; support vector machines; DI channels; DO channels; FPGA; digital circuit fault diagnosis; matrix switch; support vector machine; universal experimental system; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Fault diagnosis; Field programmable gate arrays; Pins; Support vector machines; Switches; Switching circuits; Support Vector Machine(SVM); digital circuits; experimental system; fault diagnosis;
Conference_Titel :
Intelligent Systems, 2009. GCIS '09. WRI Global Congress on
Conference_Location :
Xiamen
Print_ISBN :
978-0-7695-3571-5
DOI :
10.1109/GCIS.2009.306
