DocumentCode :
498321
Title :
The Study of Transformer Fault Acoustic Signal Processing Based on HHT and Wavelet Contour
Author :
Zhao, Shutao ; Pan, Liangliang ; Li, Baoshu
Author_Institution :
North China Electr. Power Univ., Baoding, China
Volume :
3
fYear :
2009
fDate :
19-21 May 2009
Firstpage :
262
Lastpage :
266
Abstract :
As the mark of sonic source category, acoustic signal also carries some architecture and running status information of transformer to be a natural character. In fault diagnosis techniques, acoustic recognition as one of the important methods was used in mechanical equipments fault diagnosis and observation system. In transformer fault diagnosis, its acoustic signal time-frequency changing has close connection with the active state. A new method of transformer fault diagnosis based on Hilbert transform and wavelet contour is developed. The fault signals and normal signals that have near and far sound field noise are extracted, and then de-noise it. Using the Hilbert transform and wavelet contour processing the measured signal, Hilbert spectrum and wavelet contour, which attribute the time-frequency changing of transformer acoustic signal, is obtained. The test result shows the character of transformer running state. It is demonstrated by actual analysis that the new detection method is one effective way for the condition evaluation and fault diagnosis of transformer.
Keywords :
Hilbert transforms; acoustic signal processing; electrical faults; fault diagnosis; transformers; wavelet transforms; Hilbert transform; acoustic recognition; acoustic signal time-frequency changing; fault diagnosis techniques; sonic source category; time-frequency changing; transformer fault acoustic signal; wavelet contour; wavelet contour processing; Acoustic measurements; Acoustic noise; Acoustic signal detection; Acoustic signal processing; Acoustic testing; Acoustic waves; Fault diagnosis; Signal processing; Time frequency analysis; Wavelet transforms; Hilbert-Huang transformation; acoustic signal; fault diagnosis; wavelet contour;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Systems, 2009. GCIS '09. WRI Global Congress on
Conference_Location :
Xiamen
Print_ISBN :
978-0-7695-3571-5
Type :
conf
DOI :
10.1109/GCIS.2009.330
Filename :
5209162
Link To Document :
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