DocumentCode :
498337
Title :
Application of Multi-Scale Fractal Feature in Defects Detection of Log X-Ray Image
Author :
Qi, Dawei ; Jin, Xuejing ; Wu, Haijun
Author_Institution :
Northeast Forestry Univ., Harbin, China
Volume :
3
fYear :
2009
fDate :
19-21 May 2009
Firstpage :
155
Lastpage :
159
Abstract :
The aim of this study is to extract the internal defects information from a log x-ray image and accurately identify the types of the defects in log by digital image processing technology and fractal theory. A method in log x-ray image defects detection based on multi-scale fractal feature (DMF) was applied in this paper. The DMF values of different regions in a log image are normally different. According to the values of DMF, the internal defects in log can be detected and classified. This method has been applied to the log image with crack and knots, the experimental result show that the DMF values of the normal regions are between 0.020 and 0.060; the DMF values of the crack regions are between 0.300 and 0.600; and the DMF values of the knot regions are between 0.100 and 0.200. This study provides a new tool for analyzing and processing log x-ray image.
Keywords :
X-ray imaging; feature extraction; fractals; image processing; defects detection; digital image processing; log X-ray image; multiscale fractal feature; Computer vision; Data mining; Digital images; Fractals; Image analysis; Image edge detection; Protection; X-ray detection; X-ray detectors; X-ray imaging; Digital Image Processing; Log Defects; Multi-Scale Fractal Feature; X-Ray Image;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Systems, 2009. GCIS '09. WRI Global Congress on
Conference_Location :
Xiamen
Print_ISBN :
978-0-7695-3571-5
Type :
conf
DOI :
10.1109/GCIS.2009.187
Filename :
5209183
Link To Document :
بازگشت