Title : 
An experimental study on the selection of Q-value for the L-GEM
         
        
            Author : 
Li, Jin-cheng ; Ng, Wing W Y ; Yeung, Daniel S.
         
        
            Author_Institution : 
Machine Learning & Cybern. Res. Center, South China Univ. of Technol., Guangzhou, China
         
        
        
        
        
        
        
            Abstract : 
Generalization error is very important in machine learning and pattern classification. However, one can not compute the generalization error for a given problem exactly. Therefore, many research efforts have been put to estimate the generalization error for a given classification problem. The localized generalization error model (L-GEM) is one of the recently proposed analytical generalization error upper bound models. In the L-GEM, an upper bound of generalization error of unseen samples within a Q-neighborhood of training samples is provided. The L-GEM has been widely adopted in many application areas, e.g. image classification, corporate credit risk prediction and construction productivity enhancement in civil engineering. However, the selection of Q value is vital to the success of L-GEM to application problems. In this work, we provide an experimental study on the selection of the Q value and found that Q value equal to half of average of input variances yield a good generalization capability of RBFNN.
         
        
            Keywords : 
generalisation (artificial intelligence); learning (artificial intelligence); pattern classification; radial basis function networks; L-GEM; Q-neighborhood; Q-value; RBFNN; localized generalization error model; machine learning; pattern classification; Analytical models; Computer errors; Computer science; Cybernetics; Error analysis; Machine learning; Neural networks; Support vector machine classification; Support vector machines; Upper bound; L-GEM; Localized Generalization Error Model; Q value; RBFNN;
         
        
        
        
            Conference_Titel : 
Machine Learning and Cybernetics, 2009 International Conference on
         
        
            Conference_Location : 
Baoding
         
        
            Print_ISBN : 
978-1-4244-3702-3
         
        
            Electronic_ISBN : 
978-1-4244-3703-0
         
        
        
            DOI : 
10.1109/ICMLC.2009.5212382