Title :
Insulator-to-metal transition of gold films observed by interferometric picometrology
Author :
Wang, Xuefeng ; Zhao, Ming ; Nolte, David D.
Author_Institution :
Dept. of Phys., Purdue Univ., West Lafayette, IN, USA
Abstract :
We obtain the complex refractive index and dielectric properties of ultra-thin gold films as a continuous function of thickness from 0.2 nm to 10 nm using picometrology. The atom-to-bulk transition of gold is observed.
Keywords :
dielectric function; gold; light interferometry; metal-insulator boundaries; metallic thin films; optical films; refractive index; refractive index measurement; Au; atom-to-bulk transition; complex refractive index; dielectric function; insulator-to-metal transition; interferometric picometrology; ultrathin gold films; Atom optics; Dielectric thin films; Gold; Insulation; Optical films; Optical interferometry; Optical refraction; Optical variables control; Substrates; Topology; (120.3940) Metrology; (310.6860) Thin films, optical properties;
Conference_Titel :
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-869-8
Electronic_ISBN :
978-1-55752-869-8
