DocumentCode
499293
Title
Insulator-to-metal transition of gold films observed by interferometric picometrology
Author
Wang, Xuefeng ; Zhao, Ming ; Nolte, David D.
Author_Institution
Dept. of Phys., Purdue Univ., West Lafayette, IN, USA
fYear
2009
fDate
2-4 June 2009
Firstpage
1
Lastpage
2
Abstract
We obtain the complex refractive index and dielectric properties of ultra-thin gold films as a continuous function of thickness from 0.2 nm to 10 nm using picometrology. The atom-to-bulk transition of gold is observed.
Keywords
dielectric function; gold; light interferometry; metal-insulator boundaries; metallic thin films; optical films; refractive index; refractive index measurement; Au; atom-to-bulk transition; complex refractive index; dielectric function; insulator-to-metal transition; interferometric picometrology; ultrathin gold films; Atom optics; Dielectric thin films; Gold; Insulation; Optical films; Optical interferometry; Optical refraction; Optical variables control; Substrates; Topology; (120.3940) Metrology; (310.6860) Thin films, optical properties;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-869-8
Electronic_ISBN
978-1-55752-869-8
Type
conf
Filename
5224373
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