Failure mode investigation of high power multi-mode InGaAs-AlGaAs strained quantum well lasers using time-resolved EL and EBIC techniques

Author

Sin, Yongkun ; Ives, Neil ; Presser, Nathan ; Moss, Steven C.

Author_Institution

Electron. & Photonics Lab., Aerosp. Corp., El Segundo, CA, USA

fYear

2009

fDate

2-4 June 2009

Firstpage

1

Lastpage

2

Abstract

We report our failure mode investigation of high power multi-mode InGaAs-AlGaAs strained quantum well (QW) lasers using time-resolved electroluminescence (EL) and electron beam induced current (EBIC) techniques.

Keywords

EBIC; aluminium compounds; electroluminescence; failure analysis; gallium arsenide; indium compounds; laser beams; laser reliability; quantum well lasers; EBIC technique; InGaAs-AlGaAs; electroluminescence; electron beam induced current; failure mode investigation; high power multimode laser; quantum well laser; strained QW laser; time-resolved EL; Degradation; Diode lasers; Fiber lasers; Laser excitation; Laser modes; Optical pumping; Power lasers; Pump lasers; Quantum well lasers; Semiconductor lasers; (140.5960) Semiconductor lasers; (230.5590) Quantum-well, -wire and -dot devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on

Conference_Location

Baltimore, MD

Print_ISBN

978-1-55752-869-8

Electronic_ISBN

978-1-55752-869-8

Type

conf

Filename

5224993