Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation

Author

Mills, B.E. ; Chau, C.F. ; Rogers, E.T.F. ; Grant-Jacob, J. ; Stebbings, S.L. ; Praeger, M. ; de Paula, A.M. ; Froud, C.A. ; Chapman, R.T. ; Butcher, T.J. ; Brocklesby, W.S. ; Frey, J.G.

Author_Institution

Optoelectron. Res. Centre, Univ. of Southampton, Southampton, UK

fYear

2009

fDate

2-4 June 2009

Firstpage

1

Lastpage

2

Abstract

XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.

Keywords

light diffraction; nanophotonics; nanostructured materials; optical harmonic generation; optical polymers; permittivity; refractive index; XUV dielectric constant; XUV diffraction; complex refractive index; high harmonic radiation diffraction; nanoscale objects; partially ordered array; polystyrene spheres; size 196 nm; Dielectric constant; Dielectric measurements; Diffraction; Extraterrestrial measurements; Frequency conversion; Mirrors; Optical pulse generation; Refractive index; Scanning electron microscopy; X-rays; (290.4020) Mie Theory; (340.7480) X-rays, Soft X-rays, Extreme Ultraviolet;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on

Conference_Location

Baltimore, MD

Print_ISBN

978-1-55752-869-8

Electronic_ISBN

978-1-55752-869-8

Type

conf

Filename

5225078