DocumentCode
499929
Title
Characterization of free-carrier nonlinearities in porous silicon waveguides
Author
Apiratikul, Paveen ; Rossi, Andrea M. ; Murphy, Thomas E.
Author_Institution
Univ. of Maryland, College Park, MD, USA
fYear
2009
fDate
2-4 June 2009
Firstpage
1
Lastpage
2
Abstract
We report the measurement of free-carrier nonlinearities in nanoporous silicon waveguides at 1550 nm. Although the waveguide is approximately 70% porous, it exhibits stronger and faster free-carrier effects than those of crystalline silicon waveguides.
Keywords
elemental semiconductors; nanoporous materials; optical variables measurement; optical waveguides; silicon; Si; crystalline silicon waveguides; faster free-carrier effects; free-carrier nonlinearities measurement; nanoporous silicon waveguides; wavelength 1550 nm; Absorption; Crystallization; Nonlinear optics; Optical refraction; Optical variables control; Optical waveguides; Power measurement; Semiconductor waveguides; Silicon; Wavelength measurement; (160.4236) Nanomaterials; (160.4330) Nonlinear optical materials; (190.5970) Semiconductor nonlinear optics; (190.7110) Ultrafast nonlinear optics; (230.7370) Waveguides;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-869-8
Electronic_ISBN
978-1-55752-869-8
Type
conf
Filename
5225300
Link To Document