Title :
Mode imaging and dispersion analysis in Terahertz waveguides using Terahertz near-field microscopy
Author :
Mitrofanov, Oleg ; Tan, Thomas ; Mark, Paul R. ; Bowden, Bradley ; Harrington, James A.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. London, London, UK
Abstract :
Mode structure, transmission loss and dispersion are characterized in low-loss (~1 dB/m) terahertz (THz) dielectric-lined hollow metallic waveguides. THz near-field probe imaging and spectroscopy is applied for precise mode imaging and selective mode probing.
Keywords :
microwave photonics; optical dispersion; optical images; optical losses; optical microscopy; optical waveguides; terahertz spectroscopy; dispersion analysis; mode imaging; near-field probe imaging; selective mode probing; terahertz dielectric-lined hollow metallic waveguide; terahertz near-field microscopy; terahertz spectroscopy; transmission loss; Coatings; Dielectrics; Hollow waveguides; Image analysis; Microscopy; Optical imaging; Optical waveguides; Probes; Propagation losses; Thickness measurement; (110.6795) Terahertz imaging; (230.7370) Waveguides;
Conference_Titel :
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-869-8
Electronic_ISBN :
978-1-55752-869-8
