Title :
Frequency noise of a microchip Raman laser
Author :
Lu, Tao ; Yang, Lan ; Carmon, Tal ; Min, Bumki ; Vahala, Kerry
Author_Institution :
Dept. Appl. Phys., California Inst. of Technol., Pasadena, CA, USA
Abstract :
We report measurement of the fundamental component of frequency noise in a micro-Raman laser fabricated on a silicon chip. A frequency noise spectral component that is equivalent to a Schawlow-Townes linewidth of 3-Hz is measured.
Keywords :
Raman lasers; elemental semiconductors; laser beams; laser noise; laser variables measurement; microchip lasers; silicon; Schawlow-Townes linewidth; Si; frequency noise measurement; microchip Raman laser; silicon chip; spectral component; Frequency measurement; Laser modes; Laser noise; Microchip lasers; Noise measurement; Optical noise; Optical pumping; Optical resonators; Pump lasers; Q factor; (140.3410) Laser resonators; (230.6080) Sources;
Conference_Titel :
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-869-8
Electronic_ISBN :
978-1-55752-869-8
