Title :
Near field imaging with assembled nanoparticles
Author_Institution :
OFS Labs., Somerset, NJ, USA
Abstract :
It is shown theoretically that a near field probe composed of several nanoparticles with optimized positions can perform much faster and with the better contrast and resolution than a probe composed of a single nanoparticle.
Keywords :
nanoparticles; near-field scanning optical microscopy; probes; assembled nanoparticle; near field imaging; near field probe; Assembly; Nanoparticles; Noise measurement; Optical imaging; Optical microscopy; Optical noise; Position measurement; Probes; Signal detection; Time measurement; (180.4243) Near-field microscopy; (310.6628) Subwavelength structures, nanostructures;
Conference_Titel :
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-869-8
Electronic_ISBN :
978-1-55752-869-8
