Title :
Technology-driven limits on DVFS controllability of multiple voltage-frequency island designs: A system-level perspective
Author :
Garg, Siddharth ; Marculescu, Diana ; Marculescu, Radu ; Ogras, Umit
Author_Institution :
Dept. of ECE, Carnegie-Mellon Univ., PA, USA
Abstract :
In this paper, we consider the case of network-on-chip (NoC) based multiple processor systems-on-chip (MPSoCs) implemented using multiple voltage and frequency islands (VFIs) that rely on fine grained dynamic voltage and frequency scaling (DVFS) for run time control of the system power dissipation. Specifically, we present a framework to compute theoretical bounds on the performance of DVFS controllers for such systems under the impact of three important technology driven constraints: reliability and temperature driven upper limits on the maximum supply voltage; inductive noise driven constraints on the maximum rate of change of voltage/frequency; and increasing manufacturing process variations. Our experimental results show that, for the benchmarks considered, any DVFS control algorithm will lose up to 87% performance, measured in terms of the number of steps required to reach a reference steady state, in the presence of maximum frequency and maximum frequency increment constraints. In addition, increasing process variations can lead to up to 60% of fabricated chips being unable to meet the specified DVFS control specifications, irrespective of the DVFS algorithm used.
Keywords :
controllability; network-on-chip; power aware computing; power control; DVFS controllability; dynamic voltage and frequency scaling; multiple processor systems on chip; multiple voltage-frequency island design; network-on-chip; system power dissipation control; Computer aided manufacturing; Constraint theory; Control systems; Controllability; Dynamic voltage scaling; Frequency; Network-on-a-chip; Power dissipation; Temperature control; Voltage control; Networks-on-chip; performance bounds; power management;
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-6055-8497-3