Title :
Event-driven gate-level simulation with GP-GPUs
Author :
Chatterjee, Debapriya ; DeOrio, Andrew ; Bertacco, Valeria
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
Logic simulation is a critical component of the design tool flow in modern hardware development efforts. It is used widely from high level descriptions down to gate level ones to validate several aspects of the design, particularly functional correctness. Despite development houses investing vast resources in the simulation task, particularly at the gate level, it is still far from achieving the performance demands required to validate complex modern designs. In this work, we propose the first event driven logic simulator accelerated by a parallel, general purpose graphics processor (GPGPU). Our simulator leverages a gate level event driven design to exploit the benefits of the low switching activity that is typical of large hardware designs. We developed novel algorithms for circuit netlist partitioning and optimized for a highly parallel GPGPU host. Moreover, our flow is structured to extract the best simulation performance from the target hardware platform. We found that our experimental prototype could handle large, industrial scale designs comprised of millions of gates and deliver a 13x speedup on average over current commercial event driven simulators.
Keywords :
coprocessors; logic simulation; parallel processing; gate level description; gate level event driven design; graphics processing unit; hardware development; high level description; logic simulation; parallel GPGPU host; tool flow design; Circuit simulation; Circuit testing; Computational modeling; Computer architecture; Computer simulation; Discrete event simulation; Graphics; Hardware; Logic design; Silicon; Gate-level simulation; General Purpose Graphics Processing Unit(GP-GPU); High-performance simulation;
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-6055-8497-3