Title :
Software-assisted hardware reliability: Abstracting circuit-level challenges to the software stack
Author :
Reddi, Vijay Janapa ; Gupta, Meeta S. ; Smith, Michael D. ; Wei, Gu-Yeon ; Brooks, David ; Campanoni, Simone
Author_Institution :
Harvard Univ., Cambridge, MA, USA
Abstract :
Power constrained designs are becoming increasingly sensitive to supply voltage noise. We propose a hardware-software collaborative approach to enable aggressive operating margins: a checkpoint-recovery mechanism corrects margin violations, while a run-time software layer reschedules the program´s instruction stream to prevent recurring margin crossings at the same program location. The run-time layer removes 60% of these events with minimal overhead, thereby significantly improving overall performance.
Keywords :
checkpointing; circuit reliability; electronic engineering computing; hardware-software codesign; microprocessor chips; program compilers; software reliability; system monitoring; aggressive operating margin; checkpoint-recovery mechanism; circuit-level challenge; hardware software codesign; hardware-software collaborative approach; power constrained microprocessor design; program compiler; program instruction stream; run-time software layer; software stack; software-assisted hardware reliability; supply voltage noise; Circuits; Collaborative software; Hardware; Noise robustness; Permission; Power system reliability; Process design; Runtime; Timing; Voltage; Hardware Software Co-Design; Runtime Optimization;
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-6055-8497-3