• DocumentCode
    500831
  • Title

    Debugging from high level down to gate level

  • Author

    Fujita, Masahiro ; Kojima, Yoshihisa ; Gharehbaghi, Amir Masoud

  • Author_Institution
    Japan Sci. & Technol. (JST), Univ. of Tokyo, Tokyo, Japan
  • fYear
    2009
  • fDate
    26-31 July 2009
  • Firstpage
    627
  • Lastpage
    630
  • Abstract
    C-based hardware designs are now accepted as means to increase design productivity. Starting with rather algorithmic design descriptions, incremental refinements are applied to generate high level synthesizable descriptions which are further processed by high-level and logic synthesis tools. C-based system level design descriptions, such as in SpecC and SystemC, can give concise and global views on the behaviors of the designs as well as structures, and various types of dependencies, such as control, data, concurrency, and others, can be extracted quickly. These dependencies can be the bases for efficient and effective debugging for all levels of design descriptions. In this paper, graph representations for various dependencies which are extracted from C-based descriptions are introduced. Then techniques on their uses for debugging in various design levels are discussed. We present static and dynamic tracing methods for dependence analysis as well as techniques that try to establish mapping between implementations and C-based design descriptions.
  • Keywords
    C language; computer debugging; hardware-software codesign; logic gates; specification languages; C-based hardware designs; SpecC system level design; SystemC level design; dependence analysis; gate level debugging; high level debugging; logic synthesis tool; Algorithm design and analysis; Concurrent computing; Control system synthesis; Control systems; Data mining; Debugging; Hardware; Logic design; Productivity; System-level design; Dependence Analysis; Equivalence Checking; High-Level Design; Post-Silicon Debug; System Level Design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-6055-8497-3
  • Type

    conf

  • Filename
    5227088