DocumentCode :
500860
Title :
Stochastic steady-state and AC analyses of mixed-signal systems
Author :
Kim, Jaeha ; Ren, Jihong ; Horowitz, Mark A.
Author_Institution :
Stanford Univ., Stanford, CA, USA
fYear :
2009
fDate :
26-31 July 2009
Firstpage :
376
Lastpage :
381
Abstract :
This paper demonstrates that the steady-state and adjoint sensitivity analyses can be extended to stochastic mixed-signal systems based on Markov chain models. The examples of such systems include digital phase-locked loops and delta-sigma data converters, of which steady-state response is statistical in nature, consisting of an ensemble of waveforms with probability distribution. For efficient Markov-chain analysis, the paper describes three methods that can limit the number of states: a state discretization scheme based on Gaussian decomposition, a state exploration algorithm that discovers the recurrent states, and a state truncation algorithm that eliminates the states with negligible stationary probabilities. The stochastic AC analysis is performed by deriving a first-order ordinary differential equation governing the perturbations in the stationary probabilities and solving it via phasor analysis. In the digital PLL and first-order DeltaSigma ADC examples, the number of states was reduced by a factor of 35 and the frequency-domain phase and noise transfer functions were simulated with a 57~22,000times speed-up compared to using transient, Monte-Carlo simulations.
Keywords :
Markov processes; differential equations; mixed analogue-digital integrated circuits; probability; stochastic processes; Gaussian decomposition; Markov chain model; adjoint sensitivity analysis; first-order ordinary differential equation; mixed-signal system; phasor analysis; probability distribution; state discretization scheme; state exploration algorithm; state truncation algorithm; stochastic AC analysis; stochastic steady-state analysis; Algorithm design and analysis; Differential equations; Frequency domain analysis; Performance analysis; Phase locked loops; Probability distribution; Sensitivity analysis; Steady-state; Stochastic resonance; Stochastic systems; Markov chains; adjoint sensitivity analysis; steady-state analysis; stochastic systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
978-1-6055-8497-3
Type :
conf
Filename :
5227117
Link To Document :
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