DocumentCode
500863
Title
Finding deterministic solution from underdetermined equation: Large-scale performance modeling by least angle regression
Author
Li, Xin
Author_Institution
ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2009
fDate
26-31 July 2009
Firstpage
364
Lastpage
369
Abstract
The aggressive scaling of IC technology results in high dimensional, strongly nonlinear performance variability that cannot be efficiently captured by traditional modeling techniques. In this paper, we adapt a novel L1 norm regularization method to address this modeling challenge. Our goal is to solve a large number of (e.g., 104~106) model coefficients from a small set of (e.g., 102~103) sampling points without over-fitting. This is facilitated by exploiting the underlying sparsity of model coefficients. Namely, although numerous basis functions are needed to span the high dimensional, strongly nonlinear variation space, only a few of them play an important role for a given performance of interest. An efficient algorithm of least angle regression (LAR) is applied to automatically select these important basis functions based on a limited number of simulation samples. Several circuit examples designed in a commercial 65 nm process demonstrate that LAR achieves up to 25times speedup compared with the traditional least squares fitting.
Keywords
integrated circuits; large scale integration; least squares approximations; nonlinear equations; IC technology; L1 norm regularization method; high dimensional performance variability; large-scale performance modeling; least angle regression; least squares fitting; strongly nonlinear performance variability; Circuit simulation; Delay; Equations; Integrated circuit modeling; Large-scale systems; Predictive models; Random variables; Response surface methodology; Sampling methods; Semiconductor device modeling; Process Variation; Response Surface Modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
978-1-6055-8497-3
Type
conf
Filename
5227120
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