DocumentCode
500909
Title
ARMS - Automatic residue-minimization based sampling for multi-point modeling techniques
Author
Villena, Jorge Fernández ; Silveira, L. Miguel
Author_Institution
INESC ID, Tech. Univ. Lisbon, Lisbon, Portugal
fYear
2009
fDate
26-31 July 2009
Firstpage
951
Lastpage
956
Abstract
This paper describes an automatic methodology for optimizing sample point selection for using in the framework of model order reduction (MOR). The procedure, based on the maximization of the dimension of the subspace spanned by the samples, iteratively selects new samples in an efficient and automatic fashion, without computing the new vectors and with no prior assumptions on the system behavior. The scheme is general, and valid for single and multiple dimensions, with applicability on rational nominal MOR approaches, and on multi-dimensional sampling based parametric MOR methodologies. The paper also presents an integrated algorithm for multi-point MOR, with automatic sample and order selection based on the transfer function error estimation. Results on a variety of industrial examples demonstrate the accuracy and robustness of the technique.
Keywords
electronic design automation; iterative methods; minimisation; transfer functions; automatic residue-minimization based sampling; dimension maximization; electronic design automation; integrated algorithm; iterative selection; multidimensional sampling; multipoint modeling techniques; order selection; parametric model order reduction; sample point selection optimization; transfer function error estimation; Arm; Frequency; Integrated circuit modeling; Interpolation; Iterative algorithms; Optimization methods; Permission; Robustness; Sampling methods; Transfer functions; Model Order Reduction; Multi-Dimensional Parametric Sampling;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
978-1-6055-8497-3
Type
conf
Filename
5227167
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