• DocumentCode
    500909
  • Title

    ARMS - Automatic residue-minimization based sampling for multi-point modeling techniques

  • Author

    Villena, Jorge Fernández ; Silveira, L. Miguel

  • Author_Institution
    INESC ID, Tech. Univ. Lisbon, Lisbon, Portugal
  • fYear
    2009
  • fDate
    26-31 July 2009
  • Firstpage
    951
  • Lastpage
    956
  • Abstract
    This paper describes an automatic methodology for optimizing sample point selection for using in the framework of model order reduction (MOR). The procedure, based on the maximization of the dimension of the subspace spanned by the samples, iteratively selects new samples in an efficient and automatic fashion, without computing the new vectors and with no prior assumptions on the system behavior. The scheme is general, and valid for single and multiple dimensions, with applicability on rational nominal MOR approaches, and on multi-dimensional sampling based parametric MOR methodologies. The paper also presents an integrated algorithm for multi-point MOR, with automatic sample and order selection based on the transfer function error estimation. Results on a variety of industrial examples demonstrate the accuracy and robustness of the technique.
  • Keywords
    electronic design automation; iterative methods; minimisation; transfer functions; automatic residue-minimization based sampling; dimension maximization; electronic design automation; integrated algorithm; iterative selection; multidimensional sampling; multipoint modeling techniques; order selection; parametric model order reduction; sample point selection optimization; transfer function error estimation; Arm; Frequency; Integrated circuit modeling; Interpolation; Iterative algorithms; Optimization methods; Permission; Robustness; Sampling methods; Transfer functions; Model Order Reduction; Multi-Dimensional Parametric Sampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-6055-8497-3
  • Type

    conf

  • Filename
    5227167