DocumentCode :
500910
Title :
Holistic verification: Myth or magic bullet?
Author :
Thaker, Pradip A.
Author_Institution :
Analog Devices Inc., Bangalore, India
fYear :
2009
fDate :
26-31 July 2009
Firstpage :
204
Lastpage :
208
Abstract :
Development of multi-million gate SoCs/ICs enabled by advances in submicron technology inherit verification complexity due to feature diversity on a single die and thus convergence of multiple design disciplines on one project with time-to-market pressures unchanged. For example, it is not uncommon for SoCs to integrate mixed-signal components, provide power-management features, contain instances of soft as well as hard 3rd party IPs or large building blocks developed in-house and support compliance/compatibility requirements ranging from functional to electrical aspects for various standard-based protocols. Timely and high-confidence verification sign-off for such SoCs/ICs requires a multi-prong strategy defined in this paper as holistic verification. Holistic verification emphasizes a cocktail of verification methodologies designed to address specific verification challenges of a given SoC as well as advocates aspects of verification planning and design-for-verification techniques that aid verification efforts and enhance verification efficiency. Additionally, this paper describes details of verification challenges associated with mixed-signal integration and power management features of SoCs - two distinctly different design disciplines converging in one project and thus adding growing complexity to verification.
Keywords :
integrated circuit design; logic design; mixed analogue-digital integrated circuits; system-on-chip; time to market; SoC; compatibility requirements; compliance requirements; design-for-verification; feature diversity; high confidence verification; holistic verification; mixed-signal components; mixed-signal integration; power management features; standard-based protocols; submicron technology; system-on-chip; time-to-market pressures; verification complexity; verification efficiency; verification planning; Context modeling; Convergence; Design methodology; Energy management; Permission; Project management; Protocols; Silicon; System testing; Time to market; Emulation; Mixed-signal Verification; Power management Verification; SoC Verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
978-1-6055-8497-3
Type :
conf
Filename :
5227168
Link To Document :
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