Title :
An efficient passivity test for descriptor systems via canonical projector techniques
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
Abstract :
An efficient passivity test based on matrix chain and canonical projector techniques is proposed for descriptor systems (DSs) commonly encountered in VLSI modeling. The test entails a natural flow that first evaluates the index of a DS, followed by possible decoupling into its proper and improper (if any) subsystems. Compared to the recent DS passivity tests using linear matrix inequality (LMI)-based extended positive real lemma or skew-Hamiltonian/ Hamiltonian (SHH) transformations, numerical examples show that the proposed projector approach is significantly more efficient. Explicit state space formulations for the decoupled subsystems that facilitate further processing such as passivity enforcement and model order reduction are also derived.
Keywords :
linear matrix inequalities; modelling; simulation; state-space methods; VLSI modeling; canonical projector technique; descriptor systems; efficient passivity test; explicit state space formulation; extended positive real lemma; linear matrix inequality; matrix chain; skew-Hamiltonian/Hamiltonian transformation; Circuit simulation; Decision support systems; Electronic equipment testing; Linear matrix inequalities; Permission; Radio frequency; Riccati equations; State-space methods; System testing; Very large scale integration; Passivity test; canonical projector; descriptor system; spectral projector;
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-6055-8497-3