DocumentCode :
500929
Title :
Statistical ordering of correlated timing quantities and its application for path ranking
Author :
Xiong, Jinjun ; Visweswariah, Chandu ; Zolotov, Vladimir
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
2009
fDate :
26-31 July 2009
Firstpage :
122
Lastpage :
125
Abstract :
Correct ordering of timing quantities is essential for both timing analysis and design optimization in the presence of process variation, because timing quantities are no longer a deterministic value, but a distribution. This paper proposes a novel metric, called tiered criticalities, which guarantees to provide a unique order for a set of correlated timing quantities while properly taking into account full process space coverage. Efficient algorithms are developed to compute this metric, and its effectiveness on path ranking for at-speed testing is also demonstrated.
Keywords :
circuit optimisation; integrated circuit design; integrated circuit testing; statistical analysis; timing; correlated timing quantities; design optimization; path ranking; process variation; statistical ordering; tiered criticalities; timing analysis; Algorithm design and analysis; Circuit testing; Design optimization; Extraterrestrial measurements; Feedback; Integrated circuit manufacture; Integrated circuit testing; Permission; Probability; Timing; Correlation; Path Ranking; Statistical Ordering; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
978-1-6055-8497-3
Type :
conf
Filename :
5227187
Link To Document :
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