• DocumentCode
    500931
  • Title

    A Gaussian mixture model for statistical timing analysis

  • Author

    Takahashi, Shingo ; Yoshida, Yuki ; Tsukiyama, Shuji

  • Author_Institution
    NEC Corp., Sagamihara, Japan
  • fYear
    2009
  • fDate
    26-31 July 2009
  • Firstpage
    110
  • Lastpage
    115
  • Abstract
    This paper introduces a Gaussian mixture model to represent delay and slew distributions in the statistical static timing analysis, and proposes algorithms for propagating them on a given circuit graph. The Gaussian mixture model can represent a non-Gaussian distribution due to the statistical max operation properly, and any correlation efficiently, since it consists of plural Gaussian distributions. Therefore, not only topological correlations caused by re-convergent paths but also the correlation between each element and the critical delay, which is useful for circuit optimization, are calculated easily. The propagated slews are used to compute delay distributions of circuit elements dynamically so as to improve the accuracy. The proposed Gaussian mixture model is evaluated by comparing with Monte Carlo simulation, and the results show its effectiveness.
  • Keywords
    Gaussian distribution; circuit optimisation; circuit testing; correlation methods; graph theory; network analysis; Gaussian distribution; Gaussian mixture model; Monte Carlo simulation; circuit design; circuit graph; circuit optimization; critical delay distribution; nonGaussian distribution; reconvergent path; slew distribution; statistical max operation; statistical static timing analysis; topological correlation; Algorithm design and analysis; Circuits; Delay effects; Distributed computing; Gaussian distribution; Logic gates; National electric code; Performance analysis; Propagation delay; Timing; Gaussian mixture model; delay distribution; slew distribution; statistical timing analysis; variability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-6055-8497-3
  • Type

    conf

  • Filename
    5227189