• DocumentCode
    500949
  • Title

    Worst-case aggressor-victim alignment with current-source driver models

  • Author

    Gandikota, Ravikishore ; Ding, Li ; Tehrani, Peivand ; Blaauw, David

  • Author_Institution
    Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2009
  • fDate
    26-31 July 2009
  • Firstpage
    13
  • Lastpage
    18
  • Abstract
    Crosstalk delay-noise which occurs due to the simultaneous transitions of victim and aggressor drivers is very sensitive to their mutual alignment. Hence, during static noise analysis, it is crucial to identify the worst-case victim-aggressor alignment which results in the maximum delay-noise. Although several approaches have been proposed to obtain the worst-case aggressor alignment, most of them compute only the worst-case stage delay of the victim. However, in reality it is essential to compute the worst-case combined delay of victim stage and victim receiver gate. We propose a heuristic approach to compute the worst-case aggressor alignment which maximizes the victim receiver output arrival time. In this work, we use a novel cumulative gate overdrive voltage (CGOV ) metric to model the victim receiver output transition. HSPICE simulations, performed on industrial nets to validate the proposed methodology, show an average error of 1.7% in delay-noise when compared to the worst-case alignment obtained by an exhaustive sweeping.
  • Keywords
    crosstalk; driver circuits; integrated circuit design; HSPICE simulations; crosstalk delay-noise; cumulative gate overdrive voltage metric; current-source driver models; maximum delay-noise; static noise analysis; worst-case aggressor-victim alignment; Capacitance; Crosstalk; Delay effects; Delay estimation; Integrated circuit interconnections; Integrated circuit noise; Performance analysis; Permission; Timing; Voltage; CSM; Crosstalk; delay noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-6055-8497-3
  • Type

    conf

  • Filename
    5227208