Title :
Circuit techniques for dynamic variation tolerance
Author :
Bowman, Keith ; Tschanz, James ; Wilkerson, Chris ; Lu, Shih-Lien ; Karnik, Tanay ; De, Vivek ; Borkar, Shekhar
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
Three circuit techniques for dynamic variation tolerance are presented: (i) Sensors with adaptive voltage and frequency circuits, (ii) Tunable replica circuits for timing-error prediction with error recovery, and (iii) Embedded error-detection sequential circuits with error recovery. These circuits mitigate the clock frequency guardbands for dynamic variations, thus improving microprocessor performance and energy-efficiency. These circuits are described with a focus on the different trade-offs in guardband reduction and design overhead. Opportunities for CAD to further enhance microprocessor performance and energy efficiency are offered.
Keywords :
CAD; microprocessor chips; sequential circuits; system recovery; CAD; adaptive voltage; circuit techniques; clock frequency guardbands mitigation; design overhead; dynamic variation tolerance; energy efficiency; error recovery; error-detection sequential circuits; frequency circuits; microprocessor performance; sensors; timing-error prediction; Aging; Circuits; Degradation; Delay; Energy efficiency; Error correction; Frequency; Microprocessors; Permission; Temperature; Dynamic variations; error correction; error detection; error recovery; error-detection sequential; parameter variations; replica paths; resilient circuits; timing errors; variation sensors; variation-tolerant circuits;
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-6055-8497-3