DocumentCode :
501479
Title :
An analytical expression for the I – V characteristics of AlGaN/GaN HEMTs
Author :
Elnaby, M. Abd ; Aziz, M.A. ; Shalaby, Abdel Aziz ; El-Abd, Ali
Author_Institution :
Fac. of Eng., Tanta Univ., Tanta, Egypt
fYear :
2009
fDate :
17-19 March 2009
Firstpage :
1
Lastpage :
7
Abstract :
In this paper an analytical expression for the current-voltage (I-V) characteristics of AlGaN/GaN HEMTs is presented. Two functions are suggested to model the dependence of the voltage parameter on drain voltage. The resultant I-V relationship incorporates the 2DEG sheet carrier concentration and mobility product. It also includes the effect of source and drain resistances. The obtained analytical relationship helps speeding up the I-V calculations meanwhile, keeping it simple and accurate. Due to its simplicity, it is ideally suited for circuit simulation purposes. The validity of the I-V results was tested and satisfactory results were obtained over a wide range of bias voltages.
Keywords :
aluminium compounds; gallium compounds; high electron mobility transistors; 2DEG sheet carrier concentration; AlGaN-GaN; HEMT; circuit simulation purposes; current-voltage characteristics; drain resistances; drain voltage; mobility product; source resistances; voltage parameter; Aluminum gallium nitride; Circuit simulation; Circuit testing; Conducting materials; Gallium nitride; HEMTs; MODFETs; Sheet materials; Telecommunications; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Science Conference, 2009. NRSC 2009. National
Conference_Location :
New Cairo
ISSN :
1110-6980
Print_ISBN :
978-1-4244-4214-0
Type :
conf
Filename :
5233482
Link To Document :
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