Title :
Total-dose worst-case test vectors for leakage current failure induced in combinational circuits of cell-based ASICs
Author :
Abou-Auf, Ahmed A.
Author_Institution :
Electron. Eng. Dept., American Univ. in Cairo, Cairo, Egypt
Abstract :
We developed a methodology for identifying worst-case test vectors for leakage current failure induced in combinational circuits of cell-based ASICs induced by total-dose. This methodology is independent on the design tools and the process technology.
Keywords :
application specific integrated circuits; combinational circuits; leakage currents; cell-based ASIC; combinational circuits; design tools; leakage current failure; total-dose worst-case test vectors; Application specific integrated circuits; CMOS logic circuits; Circuit faults; Circuit testing; Combinational circuits; Electronic equipment testing; Hardware design languages; Leakage current; Logic gates; MOSFETs;
Conference_Titel :
Radio Science Conference, 2009. NRSC 2009. National
Conference_Location :
New Cairo
Print_ISBN :
978-1-4244-4214-0
