DocumentCode
501883
Title
A study of GMR breakdown damage in cleaning
Author
Deng, Fei ; Teng, ZhaoYu ; Li, William ; Tao, Rock
Author_Institution
SAE Magnetics (HK) Ltd., Dongguan, China
fYear
2001
fDate
11-13 Sept. 2001
Firstpage
294
Lastpage
297
Abstract
Dielectric breakdown between MR leads and shields is a typical form of ESD damage. This paper reports an example of such damage occurring at the bar-level cleaning process. Damaged heads show no MR resistance & output changes and may be incorrectly attributed to failure due to corrosion. The investigation result unveils that charge exchange between high tribo-charge brush & GMR bonding pads is the key factor leading to breakdown.
Keywords
cleaning; electric breakdown; giant magnetoresistance; magnetoresistive devices; ESD damage; GMR bonding pad; GMR breakdown damage; MR resistance; bar-level cleaning process; charge exchange; damaged heads; dielectric breakdown; high tribo-charge brush; output change; Breakdown voltage; Brushes; Cleaning; Corrosion; Dielectric breakdown; Electric breakdown; Electrostatic discharge; Hydrocarbons; Immune system; Solvents;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location
Portland, OR
Print_ISBN
978-1-5853-7039-9
Electronic_ISBN
978-1-5853-7039-9
Type
conf
Filename
5254954
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