A study of GMR read sensor induced by soft ESD using Magnetoresistive Sensitivity Mapping (MSM)

Electrostatic discharge (ESD) can be manifest on giant magnetoresistive (GMR) head either physically (melting of sensor element) or magnetically (degrades in dynamic electrical or quasitest parameters). The latter case is usually suspected as ldquosoftrdquo ESD and known to be a subtle case for study. In this study, we try to differentiate the ldquosoftrdquo ESD from electrical failure, which cause by other means. Ahead with magnetoresistance sensitivity mapping (MSM), which is an additional feature of magnetic force microscope (MFM), the symmetry and sensitivity changes of GMR sensors were further investigated. Advanced analytical tools of atomic force microscope (AFM), MFM and MSM allow unique characterization of head microstructure, and coupled with methodical and systematic failure analysis, may be possible to observe in-situ the previously unknown ESD phenomena unique to GMR head.