Title :
Field emission noise caused by capacitance coupling ESD in AMR/GMR heads
Author :
Ohtsu, Takayoshi ; Yoshida, Hitoshi ; Hatanaka, Noriaki
Author_Institution :
Data Storage Syst. Div., Hitachi Ltd., Odawara, Japan
Abstract :
In AMR/GMR heads, we find that the field emission between shield and disk is induced by the high voltage of the write driver. This paper discusses the mechanism that the noise by field emission is the current to GMR elements caused by the capacitance coupling between shield and electrode.
Keywords :
capacitance; driver circuits; electrostatic discharge; field emission; giant magnetoresistance; magnetic heads; magnetic recording noise; magnetoresistive devices; AMR heads; GMR heads; capacitance coupling ESD; field emission noise; magnetic recording; shield-disk field emission; write driver voltage; Capacitance; Coils; Electrodes; Electron beams; Electrostatic discharge; Frequency; Magnetic heads; Magnetic noise; Magnetic recording; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location :
Portland, OR
Print_ISBN :
978-1-5853-7039-9
Electronic_ISBN :
978-1-5853-7039-9
