• DocumentCode
    501919
  • Title

    Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width-scaling

  • Author

    Mergens, Markus P J ; Verhaege, Koen G. ; Russ, Christian C. ; Armer, John ; Jozwiak, Phillip C. ; Kolluri, Girija ; Avery, Leslie R.

  • Author_Institution
    Sarnoff Corp., Princeton, NJ, USA
  • fYear
    2001
  • fDate
    11-13 Sept. 2001
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    A silicon-proven multi-finger turn-on (MFT) design technique that enables ESD width scaling combined with very low dynamic on-resistance is presented in various implementations. It can be applied to (self-protecting) drivers and/or ESD protection design. Using a novel merged ballast circuit design, very compact ESD protection configurations with an ESD area performance up to 5VHBM/um2 can be realized both in fully silicided and silicide blocked NMOS designs.
  • Keywords
    MOS integrated circuits; electrostatic discharge; elemental semiconductors; integrated circuit design; silicon; ESD protection design; NMOS designs; ballast circuit design; multi-finger turn-on circuits; silicon-proven multi-finger turn-on design technique; width-scaling; Circuits; Electrostatic discharge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-5853-7039-9
  • Electronic_ISBN
    978-1-5853-7039-9
  • Type

    conf

  • Filename
    5254992
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=501919