Title :
Customer flicker emission assessment: A new method based on RMS value measurements
Author :
Yang, Xavier ; Klein, Fabienne ; Kratz, Maurice ; Gauthier, Jacques
Author_Institution :
EDF R&D - France
Abstract :
The present paper presents a simple and novel method for flicker source assessment. The method needs small volume of on-site data recordings; it is based on electromechanical transient simulation with recorded customer load impedance variations and simplified IEC flicker meter emulator. The method makes it possible to assess flicker emission with fast monitoring electric RMS values. It may be used by system operators to perform flicker assessment with their available power quality monitoring data.
Keywords :
IEC flicker meter emulator; Plt; Pst; flicker assessment; flicker source models; full wave detector;
Conference_Titel :
Electricity Distribution - Part 1, 2009. CIRED 2009. 20th International Conference and Exhibition on
Conference_Location :
Prague, Czech Republic
Print_ISBN :
978-1-84919126-5