Title :
Different CDM ESD Simulators provide different failure thresholds from the same device even though all the simulators meet the CDM standard specifications
Author :
Henry, L.G. ; Narayan, R. ; Johnson, L. ; Hernandez, M. ; Grund, E. ; Kyungjim Min ; Yoon Huh
Author_Institution :
ESD/TLP Consultants, Fremont, CA, USA
Abstract :
Existing CDM Standards allow the use of limited bandwidth oscilloscopes that are unable to capture the true CDM discharge waveforms. This limitation allows significantly different pulses from different testers to meet the standards, resulting in inconsistent results from stressed devices. Different failure thresholds have been obtained from the same devices using different testers that all comply with the industry CDM standards.
Keywords :
electron device testing; electrostatic discharge; CDM ESD simulators; limited bandwidth oscilloscopes; Bandwidth; Capacitance; Circuit testing; Earth Observing System; Electrostatic discharge; Equations; Integrated circuit modeling; Measurement standards; Oscilloscopes; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-5853-7115-0
