DocumentCode
502577
Title
A frequency-domain VFTLP pulse characterization methodology and its application to CDM ESD modeling
Author
Ito, C. ; Loh, W. ; Tze Wee Chen ; Dutton, R.W.
Author_Institution
LSI Logic Corp., Milpitas, CA, USA
fYear
2006
fDate
10-15 Sept. 2006
Firstpage
318
Lastpage
325
Abstract
A frequency-domain methodology to determine the risetime and pulse width of a pulse generated by a very-fast transmission line pulsing (VFTLP) system was developed. By assuming a trapezoidal waveform and fitting its Fourier spectrum to the spectrum analyzer measurement, the risetime of the pulse from the VFTLP system was calculated to be less than 25 ps, and the pulse width was characterized down to 300 ps, both of which are the fastest to date. The resulting modified VFTLP system can generate pulses that model the coupled CDM pulses that were recently identified as causing failure in the core circuitry. This core pulse has a 60 ps risetime and a 140 ps pulse width, and the modified VFTLP system can produce a better approximation of these extremely fast pulses.
Keywords
Fourier analysis; electrostatic discharge; frequency-domain analysis; pulse generators; transmission lines; CDM ESD modeling; Fourier spectrum; core pulse; frequency-domain VFTLP pulse characterization methodology; pulse risetime; pulse width; spectrum analyzer measurement; trapezoidal waveform; very-fast transmission line pulsing system; Character generation; Coupling circuits; Electrostatic discharge; Frequency domain analysis; Pulse circuits; Pulse generation; Pulse measurements; Space vector pulse width modulation; Spectral analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.
Conference_Location
Anaheim, CA
Print_ISBN
978-1-5853-7115-0
Type
conf
Filename
5256763
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