Title :
Transmission line pulse (TLP) testing of radio frequency (RF) micro-machined micro-electromechanical systems (MEMS) switches
Author :
Tazzoli, A. ; Peretti, V. ; Zanoni, E. ; Meneghesso, G.
Author_Institution :
Dept. of Inf. Eng., Univ. of Padova, Padova, Italy
Abstract :
Radio frequency micro-electromechanical (RF-MEM) switches, both ohmic and capacitive, are important for future RF wired and wireless communication systems. In this paper, transmission line pulse testing and ESD characterization is shown for the first time. A new TLP methodology, an extension to classical TLP plot analysis, is presented and it is demonstrated as this new technique is necessary to correctly investigate the TLP response of RF-MEMS switches.
Keywords :
electrostatic discharge; microswitches; microwave switches; radiocommunication; transmission lines; ESD characterization; MEMS switch; micromachined microelectromechanical systems; radio frequency switch; transmission line pulse testing; wireless communication system; Communication switching; Electrostatic discharge; Microelectromechanical systems; Micromechanical devices; Radio frequency; Radiofrequency microelectromechanical systems; Switches; System testing; Transmission lines; Wireless communication;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-5853-7115-0
