Title :
Analysis of Barkhausen noise failure caused by ESD in a GMR head
Author :
Hamaguchi, Takehiko ; Ichihara, Takayuki ; Ohtsu, Takayoshi
Author_Institution :
Information Storage Research Dept., Central Research Lab., Hitachi, Ltd., Japan
Abstract :
We used a spin-stand with a pre-amplifier with a built-in ESD simulator circuit to investigate a new magnetic failure mode caused by ESD current. This failure mode originates in Barkhausen noise from unexpected domain walls in the free layer of a giant magnetoresistive (GMR) head. According to a modified machine model (0 Ω, 50 pF), this failure occurs at around 0.5 V, i.e., a quarter of that at which a conventional pinned layer reversal failure occurs.
Keywords :
Circuit noise; Circuit simulation; Electrostatic discharge; Failure analysis; Giant magnetoresistance; Magnetic analysis; Magnetic circuits; Magnetic domain walls; Magnetic heads; Magnetic noise;
Conference_Titel :
2002 Electrical Overstress/Electrostatic Discharge Symposium, 2002. EOS/ESD '02.
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
978-1-5853-7040-5
Electronic_ISBN :
978-1-5853-7040-5
