Title :
Optimization of input protection diode for high speed applications
Author :
Worley, Eugene R. ; Bakulin, Alex
Author_Institution :
Conexant Systems, 4311 Jamboree Rd., Newport Beach, CA 92660, USA
Abstract :
Optimization of input protection diodes for high-speed applications including RF and Internet receivers is examined. The key parameters used to rate the diodes are the RC time constant and the failure point defined by HBM failure voltage per unit of capacitance. Minimizing the RC time constant for stripe diodes includes looking at tapered metal, wide ground stripes, slot contacts, background doping, and the length of the stripes. Maximizing the failure point includes looking at tapered metal, contacts, and proximity effects.
Keywords :
Diodes; Protection;
Conference_Titel :
2002 Electrical Overstress/Electrostatic Discharge Symposium, 2002. EOS/ESD '02.
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
978-1-5853-7040-5
Electronic_ISBN :
978-1-5853-7040-5