Title :
Transient voltage overshoot in TLP testing — Real or artifact?
Author :
Tremouilles, D. ; Thijs, S. ; Roussel, Ph ; Natarajan, M.I. ; Vassilev, V. ; Groeseneken, G.
Author_Institution :
IMEC vzw, Leuven, Belgium
Abstract :
This paper investigates on the transient pulse response of the device under test, which is becoming a critical aspect in determining the ESD reliability of a variety of technology products. For the first time, the feasibility to calibrate or tune the artifacts arising out of system parasitic to `see´ the device transient response is presented in this paper with experimental data and numerical analysis.
Keywords :
electrostatic discharge; semiconductor device reliability; transient response; ESD reliability; TLP testing; transient pulse response; transient voltage overshoot; transmission line pulse; Current measurement; Data mining; Electrostatic discharge; Power system transients; Protection; Pulse measurements; Testing; Time measurement; Transient response; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-069-6
Electronic_ISBN :
978-1-58537-069-6
