• DocumentCode
    502993
  • Title

    A low leakage low cost-PMOS based power supply clamp with active feedback for ESD protection in 65nm CMOS technologies

  • Author

    Smith, Jeremy C. ; Cline, Roger A. ; Boselli, Gianluca

  • Author_Institution
    ASIC Circuit Design Group, Austin, TX, USA
  • fYear
    2005
  • fDate
    8-16 Sept. 2005
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    A novel PMOS based power supply protection clamp is presented which is designed to operate in a state-of-the art 65 nm, low leakage CMOS process. The design is shown to be amenable to the inherent challenges posed by low cost I/O transistors. Robust ESD and electrical operation is shown as well as immunity to transient latch-up.
  • Keywords
    MOSFET; circuit feedback; electrostatic discharge; low-power electronics; CMOS technology; ESD protection; MOSFET power; active feedback circuit; electrical operation; low-leakage low cost-PMOS; power supply clamp; size 65 nm; Art; CMOS process; CMOS technology; Clamps; Costs; Electrostatic discharge; Feedback; Power supplies; Process design; Protection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
  • Conference_Location
    Tucson, AZ
  • Print_ISBN
    978-1-58537-069-6
  • Electronic_ISBN
    978-1-58537-069-6
  • Type

    conf

  • Filename
    5271748