Title :
A low leakage low cost-PMOS based power supply clamp with active feedback for ESD protection in 65nm CMOS technologies
Author :
Smith, Jeremy C. ; Cline, Roger A. ; Boselli, Gianluca
Author_Institution :
ASIC Circuit Design Group, Austin, TX, USA
Abstract :
A novel PMOS based power supply protection clamp is presented which is designed to operate in a state-of-the art 65 nm, low leakage CMOS process. The design is shown to be amenable to the inherent challenges posed by low cost I/O transistors. Robust ESD and electrical operation is shown as well as immunity to transient latch-up.
Keywords :
MOSFET; circuit feedback; electrostatic discharge; low-power electronics; CMOS technology; ESD protection; MOSFET power; active feedback circuit; electrical operation; low-leakage low cost-PMOS; power supply clamp; size 65 nm; Art; CMOS process; CMOS technology; Clamps; Costs; Electrostatic discharge; Feedback; Power supplies; Process design; Protection;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-069-6
Electronic_ISBN :
978-1-58537-069-6
