Title :
Experience in HBM ESD testing of high pin count devices
Author :
Brodbeck, Tilo ; Gaertner, Reinhold
Author_Institution :
Infineon Technol. AG, Munich, Germany
Abstract :
HBM ESD sensitivity testing of high pin count devices is a challenge for current testers and the standardized test procedure. Alternative HBM test procedures are described for the test of devices with fewer tester channels than device pins. Experimental results for the ldquoSplit-IOrdquo test method are presented and the risks of divergent results are discussed.
Keywords :
electrostatic discharge; integrated circuit testing; sensitivity analysis; HBM ESD sensitivity testing; high pin count device; microelectronic component; split-IO test method; standardized test procedure; Costs; Electrostatic discharge; IEC standards; Manufacturing; Microelectronics; Military standards; Performance evaluation; Pins; Power supplies; System testing;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-069-6
Electronic_ISBN :
978-1-58537-069-6
