Impact of the CDM tester ground plane capacitance on the DUT stress level

The CDM ground plane capacitance C_GP is a key parameter for the tester modeling. From a test point of view, we show that the CDM test result depends on C_GP, and thus of all parameters which influence it, like the ground plane size or the DUT package thickness. Then from a simulation point of view, we have to take into account C_GP since this value defines the right voltage stress applied on the simulated circuit.