Title :
Snapback device studies using multilevel TLP and multi-impedance TLP testers
Author_Institution :
Oryx Instrum. Corp., Fremont, CA, USA
Abstract :
Standard 50-ohm TDR TLP systems do not accurately measure the clamp voltage and minimum holding currents of snapback ESD protection structures. Two methods are presented that can accurately determine device operation at the turn-on point. Multilevel TLP generated with charge lines is contrasted with 100-to-1000-ohm TDRT for snapback parameter determination.
Keywords :
electric current measurement; electrostatic discharge; integrated circuit testing; transmission lines; voltage measurement; clamp voltage measurement; electrostatic discharge protection; holding current measurement; snapback device; transmission line pulsing; Biological system modeling; Electrostatic discharge; Impedance; Protection; Pulse generation; Reflection; Resistors; System testing; Transmission lines; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-069-6
Electronic_ISBN :
978-1-58537-069-6
