Title :
Wrist strap monitor testing for use with the latest MR head technologies
Author :
Salisbury, Jeffrey M. ; Stuckert, George A. ; Oswald, NiCole R. ; Meyer, Richard L.
Author_Institution :
Seagate Technol., Shakopee, MN, USA
Abstract :
The disturbing downward trend of GMR/TGMR ESD Sensitivity has led companies to scrutinize their ESD Controls. The monitoring equipment, installed to control ESD, could potentially cause harm instead. This test method and data should assist the end user in selecting the most suitable wrist strap monitoring technology for today´s heads.
Keywords :
giant magnetoresistance; magnetoresistive devices; monitoring; ESD controls; GMR/TGMR ESD sensitivity; end user; latest MR head technology; monitoring equipment; wrist strap monitor testing; wrist strap monitoring; Biological system modeling; Capacitance; Condition monitoring; Drives; Electrostatic discharge; Inductance; Performance evaluation; Testing; Voltage; Wrist;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
Conference_Location :
Las Vegas, NB
Print_ISBN :
978-1-5853-7057-3
Electronic_ISBN :
978-1-5853-7057-3
