DocumentCode
503030
Title
Wrist strap monitor testing for use with the latest MR head technologies
Author
Salisbury, Jeffrey M. ; Stuckert, George A. ; Oswald, NiCole R. ; Meyer, Richard L.
Author_Institution
Seagate Technol., Shakopee, MN, USA
fYear
2003
fDate
21-25 Sept. 2003
Firstpage
1
Lastpage
5
Abstract
The disturbing downward trend of GMR/TGMR ESD Sensitivity has led companies to scrutinize their ESD Controls. The monitoring equipment, installed to control ESD, could potentially cause harm instead. This test method and data should assist the end user in selecting the most suitable wrist strap monitoring technology for today´s heads.
Keywords
giant magnetoresistance; magnetoresistive devices; monitoring; ESD controls; GMR/TGMR ESD sensitivity; end user; latest MR head technology; monitoring equipment; wrist strap monitor testing; wrist strap monitoring; Biological system modeling; Capacitance; Condition monitoring; Drives; Electrostatic discharge; Inductance; Performance evaluation; Testing; Voltage; Wrist;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
Conference_Location
Las Vegas, NB
Print_ISBN
978-1-5853-7057-3
Electronic_ISBN
978-1-5853-7057-3
Type
conf
Filename
5271993
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