DocumentCode :
503036
Title :
Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD)
Author :
Voldman, Steven H. ; Ashton, Robert ; Barth, Jon ; Bennett, David ; Bernier, Joseph ; Chaine, Michael ; Daughton, Jeffrey ; Grund, Evan ; Farris, Marti ; Gieser, Horst ; Henry, Leo G. ; Hopkins, Mike ; Hyatt, Hugh ; Natarajan, M.I. ; Juliano, Patrick ; Ma
fYear :
2003
fDate :
21-25 Sept. 2003
Firstpage :
1
Lastpage :
10
Abstract :
Standardization of the methodology of transmission line pulse (TLP) testing has become a necessary reality as it becomes a common place practice in the ESD discipline. This paper discusses the development and method of a TLP standard practice.
Keywords :
electrostatic discharge; semiconductor device testing; transmission lines; ESD; electrostatic discharge; semiconductor device; transmission line pulse testing; Circuit testing; Design engineering; EMP radiation effects; Electronic equipment testing; Electronics industry; Electrostatic discharge; Reliability engineering; Semiconductor device testing; Standardization; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-5853-7057-3
Electronic_ISBN :
978-1-5853-7057-3
Type :
conf
Filename :
5271999
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=503036
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