• DocumentCode
    503059
  • Title

    ESD protection design for giga-Hz RF CMOS LNA with novel impedance-isolation technique

  • Author

    Ker, Ming-Dou ; Lee, Chien-Ming

  • Author_Institution
    Nanoelectron. & Gigascale Syst. Lab., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
  • fYear
    2003
  • fDate
    21-25 Sept. 2003
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    A novel ESD protection design with impedance-isolation technique is proposed and successfully verified in a 0.25-mum CMOS process with top thick metal. Its purpose is to reduce the detrimental effect of the on-chip ESD protection circuit on the power gain and noise figure of an RF LNA circuit. With the resonance of LC-tank, the impedance generated from the ESD protection devices can be isolated from the input node of RF LNA at the operation frequency, so the power gain loss and noise figure of RF LNA can be successfully codesigned with the desired ESD robustness. The proposed ESD protection circuit with novel impedance-isolation technique will be one of the most effective ESD protection solutions for RF circuits in higher frequency band (> 10 GHz).
  • Keywords
    CMOS integrated circuits; UHF amplifiers; UHF integrated circuits; electrostatic discharge; low noise amplifiers; ESD protection design; LC-tank resonance; RF CMOS LNA; impedance-isolation technique; noise figure; on-chip ESD protection circuit; power gain; size 0.25 mum; CMOS process; Circuits; Electrostatic discharge; Impedance; Noise figure; Noise robustness; Power generation; Protection; Radio frequency; Resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    978-1-5853-7057-3
  • Electronic_ISBN
    978-1-5853-7057-3
  • Type

    conf

  • Filename
    5272022