Title :
Real HBM & MM – the dV/dt threat
Author :
Barth, Jon ; Richner, John ; Henry, Leo G. ; Kelly, Mark
Author_Institution :
Barth Electron., Inc., Boulder City, NV, USA
Abstract :
Recent ldquorealrdquo HBM and MM discharge waveform measurements provide completely new data on the risetime and peak current threats. Additional investigation was performed to determine impact of humidity and electric field effects on the discharge event. Given the new information, redesign of ESD simulators and development of test standards representing real world ESD threats are essential.
Keywords :
electric field effects; electric variables measurement; electrostatic discharge; ESD simulator; discharge waveform measurement; electric field effect; human body model; humidity; machine model; peak current threat; test standard; Current measurement; Electrostatic discharge; Inductance measurement; Measurement standards; Oscilloscopes; Protection; Sparks; Standards development; Testing; Velocity measurement;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-5853-7057-3
Electronic_ISBN :
978-1-5853-7057-3
