Title :
Comprehensive ESD protection for RF inputs
Author :
Hyvonen, Sami ; Joshi, Sopan ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
We demonstrate that narrow-band tuned circuits may be used for ESD protection of RF inputs, and a figure of merit for optimization of these circuits is presented. The performance of the ESD protected RF circuit is dependent on the quality factor of the ESD device, and various protection devices are evaluated in this work. Broadband circuit protection is also addressed.
Keywords :
electrostatic discharge; power electronics; radiofrequency integrated circuits; ESD protection; RF inputs; broadband circuit protection; protection devices; quality factor; Electrostatic discharge; Impedance; Inductors; Narrowband; Parasitic capacitance; Protection; RLC circuits; Radio frequency; Shunt (electrical); Tuned circuits;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-5853-7057-3
Electronic_ISBN :
978-1-5853-7057-3
